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Materials Research Laboratory
Materials Research Laboratory
- Center for Microanalysis of Materials
- Laser-assisted Growth and Site-Selective Doping
- Near-Field Microscopy and Spectroscopy
^ Center for Microanalysis of Materials
I. Petrov,* J. E. Baker, S. A. Burdin, B. E. Clymer, K. Colravy, N. Finnegan, R. T. Haasch, Y. W. Kim, J. Mabon, G. Metze, V. Petrova, M. Sardela, E. A. Sammann, W. Swiech, R. Twesten, M. Williams, M. Marshall, S. MacLaren
U.S. Department of Energy, DE-FG02-91ER45439
The Center for Microanalysis of Materials, an integral part of the Frederick Seitz Materials Research Laboratory, is a DOE national facility that is a major repository of instrumentation and expertise focused on the microcharacterization of materials. The center enables and contributes to the research carried out by scientists at the University of Illinois, at other universities, at national laboratories, and in industrial laboratories. In addition, the equipment is used for research programs initiated by staff members in the center. Of these, the major programs are listed separately, but a continuing research effort is also under way on a wide range of topics in transmission, scanning, and low-energy electron microscopy; scanning probe microscopies; Auger, x-ray photoelectron, and secondary ion mass spectroscopy; x-ray diffraction; and related areas.
^ Laser-assisted Growth and Site-Selective Doping
J. O. White,* S. Rhee
U.S. Department of Energy, DE-FG02-91ER45439
Dopant atoms in a crystalline host often have a choice of several sites in which to reside. Researchers are investigating novel ways of using laser illumination to encourage the occupation of some sites and discourage the occupation of other sites. Illumination both during and after growth is being considered. Growth from solution, MBE, and MOCVD are being investigated. At present, this research team is focusing on rare-earth dopants.
^ Near-Field Microscopy and Spectroscopy
J. O. White,* J. Kim
U.S. Department of Energy, DE-FG02-91ER45439
Near-field microscopy can be combined with conventional far-field spectroscopy to yield topographic and compositional information with subwavelength spatial resolution. Researchers are studying a variety of novel materials with a scanning optical microscope based on a tapered fiber probe. Spatial resolution of ~100 nm is obtainable, with a sensitivity high enough to detect fluorescence from a single molecule. When 1 mm resolution is sufficient, the microscope used for this project can operate in a far-field confocal mode. Ongoing microscopy experiments include photoluminescence of InGaN, Raman spectroscopy of GaN, fluorescence of living cells, and fluorescence of polymer/metal-nanoparticle blends.
