Corn Starch Yield Calibrations with NIR
M. R. Paulsen,* S. W. Mbuvi
Illinois Council for Food and Agriculture Research; U.S. Department of Agriculture

Corn starch yield is affected by variety and environmental and drying conditions. One hundred gram starch yields provided a reference for developing an extractable starch calibration on a NIRSystems Model 6500 spectrophotometer. A calibration was developed from 791 samples that had a standard error of cross validation (SECV) of 1.023%. This indicates about 95% of similar samples could have starch yield predicted by NIR within about ± 2 percentage points. With a wider range of samples and by adding repeatability files, the SECV is capable of being improved to about 0.65 to 0.90, based on the standard error of the laboratory reference method.