PAPERS PRESENTED AT CONFERENCES AND SYMPOSIA

Cementitious Materials

YOUNG, J. F. Status of R & D in production technology and properties of fresh concrete. RILEM, Int. Congr. on Production Meth. and Workability of Fresh Concr. (Glasgow, Scotland, Jun. 1996).
YOUNG, J. F. Highly reactive dicalcium silicates belite cements. RILEM Seminar on Concr. from Mater. to Struct. (Arles, France, Sept. 1996).
YOUNG, J. F. Organo-cement composites (MDF cements): current status. MAETA Wkshp. on High Flexural Polym.-Cement Compos. (Sakata, Japan, Oct. 1996).
YOUNG, J. F. Recent advances in the development of high performance cement-based materials. Materials for the New Millennium (Chong, ed.; ASCE) Proc. 4th ASCE Mater. Conf. (Washington, D.C., Nov. 1996) 1101-1110 (1996).

Ceramic and Glassy Solids

DUFFRENE, L. and J. KIEFFER. Pressure-induced structural transformation in cristobalite studied by molecular dynamic simulation. Mater. Res. Soc. Symp. Proc., 398, 451-456 (1996).
MASNIK, J., O. NICKLAYEV, J. KIEFFER, and J. D. BASS. Structural developments in fragile glass forming systems. Mater. Res. Soc. Symp. Proc., 407, 209-304 (1996).
NEKHAYEV, O. and J. KIEFFER. Clustering and extended range order in binary network glasses. Mater. Res. Soc. Symp. Proc., 408, 363-368 (1996).

Electrical Ceramics

CLEM, P. G., N-L. JEON, R. G. NUZZO, and D. A. PAYNE. Micron-scale patterning of solution-derived ceramic thin films directed by self assembled monolayers. Mater. Res. Soc. Symp. Proc., 435, 521-526 (1996).
CLEM, P. G., Z. XU, and D. A. PAYNE. Epitaxy and monolayer patterning of solution-derived LiNbO;i3 thin layers. Mater. Res. Soc. Symp. Proc., 401, 249-254 (1996).

Phase Transformation and Microcharacterization

BELLON, P. and P. PARTYKA. Kinetic roughening of interfaces and mixing in alloys under shear or irradiation. Mater. Res. Soc. Symp. E Proc., 400, 3 (1996).
LEE, S. W., D. LIU, P. P. TSAI, and H. CHEN. Study of microstructure and gas sensing properties of tin oxide thin films prepared by MOCVD. Mater. Res. Soc. Symp. Proc., 415, 237-242 (1996).
MURALIDHARAN, G., E. EPPERSON, and H. CHEN. Experimental studies on the effect of coherency stresses on coarsening kinetics: current status and future outlook. ICPM-94 (Bombay, India, Mar. 1994), Advances in Physical Metallurgy (Banerjee and Ramanujan, eds.; Gordon and Breach) 333-344 (1996).
POCHET, P., P. BELLON, L. CHAFFRON, and G. MARTIN. Order-disorder transition under shearing: application to ball milling. Mater. Res. Soc. Symp. E Proc., 400, 13 (1996).

Thin-Film Electronics

ALLEN, L. H., S.-L. LAI, P. INFANTE, and G. RAMANATH. Calorimetry measurements in thin-film systems using scanning microcalorimetry. Int. Conf. on Metal Coatings and Thin Films (San Diego, Calif., Apr. 1996).
BATZER, R. S., B. M. YEN, D. LIU, H. KUBO, G. R. BAI, and H. CHEN. High-temperature x-ray diffraction study of PbTiO;i3 thin films grown on MgO(100) by MOCVD. Mater. Res. Soc. Symp. Proc., 415, 207-212 (1996).
BERGSTROM, D. B., I. PETROV, and J. E. GREENE. Microstructural and microchemical studies of model diffusion barrier systems: interfacial metal/barrier reaction paths. SRC Wkshp. on Cu Interconnects (Troy, N.Y., Jun. 1996).
CAHILL, D. G. and S.-M. LEE. Progress in the study of thin film thermal conductivity. 17th Japan Symp. on Thermophys. Properties (Tsukuba, Japan, Nov. 1996).
GREENE, J. E. Atomic-level control during semiconductor and metal film growth under highly kinetically constrained conditions. Mater. Res. Soc. Spring Mtg. (San Francisco, Calif., Apr. 1996).
GREENE, J. E. Crystal growth of metastable thin films: microstructure, ordering, physical properties, and thermal stability. 10th Int. Conf. on Thin Films and 5th Euro. Vac. Conf. (Salamonca, Spain, Sept. 1996).
GREENE, J. E. Fundamental limits for low-temperature epitaxy. Int. Center for Theoret. Phys. (Trieste, Italy, Mar. 1996).
GREENE, J. E. Low-energy ion and hyperthermal beams for semiconductor and metal film growth. Gordon Res. Conf. on Laser Interactions with Mater. (Holderness, N. H., Jun. 1996).
GREENE, J. E. Low-energy ion and hyperthermal beams for semiconductor and metal film growth: effects on nucleation, microstructure evolution, epitaxial thickness, roughening, and strain relaxation. Mater. Res. Soc. of Japan and 3rd Ion Engr. Conf. (Chiba, Japan, May 1996).
GREENE, J. E. Low-energy ion and hyperthermal neutral beams for semiconductor and metal film growth: effects on nucleation, microstructure evolution, epitaxial thickness, roughening, and strain relaxation. IUVSTA Wkshp. on Nanoscale Modification of Surf. and Thin Films: Physical and Chem. Aspects (Lake Ballaton, Hungary, Sept. 1996).
GREENE, J. E. Low-temperature epitaxy. Amer. Vac. Soc. Symp. (Albuquerque, N. Mex., Apr. 1996).
LAI, S.-L., P. INFANTE, G. RAMANATH, and L. H. ALLEN. An ultrafast thin-film microcalorimeter with monolayer sensitivity (J/m;s2). Proc. Mater. Res. Soc. Symp., 398, 469 (1996).
LEE, S.-M. and D. G. CAHILL. Influence of interface conductance on the apparent thermal conductivity of thin films. Microscale Thermophys. Engr. 1, 2nd U.S.-Japan Seminar on Molec. and Microscale Transport Phenomena (Aug. 1996).
LIN, C-H. and H. CHEN. Electrocermic thin films: a short review. Proc. 1996 Int. Electron. Devices and Mater. Symp., Symp. C (Hsinchu, Taiwan, Dec. 1996) 69-76 (1996).
PETROV, I. and J. E. GREENE. Epitaxial growth of transition metal nitrides on metal-ion etched ferritic and austenitic steel substrates. 2nd Int. Conf. on Large Area Coating: ABS Technol. (Sheffield, England, Jul. 1996).
PETROV, I. and J. E. GREENE. Fundamentals of transition metal nitride crystal growth. 10th Int. Conf. on Thin Films and 5th Euro. Vac. Conf. (Salamonca, Spain, Sept. 1996).
PETROV, I. and J. E. GREENE. Microstructural evolution, defect structure, and development of preferred orientation during growth of transition-metal nitride films. Amer. Vac. Soc. Symp. (Orlando, Fla., Mar. 1996).
PETROV, I. and J. E. GREENE. Microstructure of interfaces and multilayer coatings prepared by combined arc/magnetron deposition techniques. Int. Conf. on Met. Coatings and Thin Films (San Diego, Calif., Apr. 1996).
RAMANATH, G., V. C. HORNBACK, D. J. ALLMAN, J. R. A. CARLSSON, and L. H. ALLEN. F accumulation in Ti: the cause of adhesion failure of TiN/Ti liner on SiO;i2 during W CVD. IEEE VLSI Multilevel Interconnect Conf. (Santa Clara, Calif., Jun. 1996).